The paper mentions that a necessary part of tuning requires putting the circuit into a chaotic state whereby crosstalk from power switching causes gate excitation and so the resulting waveform is aperiodic. This makes for a great wall of obfuscation to hide behind and makes comprehensive analysis through finite sample analysis impossible. I totally agree with this and therefore have offered an alternative test method that does not require finite sample analysis. This in no way should be meant to take away anything from the noteable work Poynt has done in this area. Kudos to Poynt for his Herculean effort. But for those who do not have access to expensive data loggers, exotic scopes and wish to play with the Ainslie circuit, I would highly recommend a simple way of testing the circuit by using the attached diagram. A simple differential thermocouple setup will show discrepancies in temperature between the DUT and the control. Since both resistors will be pulsed identically, there is no need for absolute temperature measurement, any differences between the DUT and control will be a differential in temperature. The control resistor should be a carbon composition or other non-inductive type with about the same thermal mass and surface area as the DUT. Also a potentiometer can be placed in the gate of the DUT firing FET and adjusted for the so called "chaotic" condition. I will later post the circuit for the differential thermocouple technique which can be used with a cheap DVM.
« Last Edit: 2009-12-15, 20:58:48 by ION »
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